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CONTACT MECHANICS AT THE SUB-MICRON AND NANOMETER SCALES
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WEEK 1 |
Introduction, scaling laws for mechanical systems at the micron and sub-micron scale
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WEEK 2 |
Atomic scale forces of relevance in Scanning Probe Microscopy, short & long-range interactions (electrostatic, van der Waals, capillary, double layer forces)
Mechanics of (adhesive) elastic contact, Hertz, JKR, DMT, Maugis/Dugdale model
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WEEK 3 |
Nanoindentation principles and instrumentation
Formulation of models and equations for nanoindentation. Characterization of elastic, fracture, frictional, and viscoelastic surface properties
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SCANNING PROBE MICROSCOPY
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WEEK 4 |
Scanning Probe Microscopy (SPM) principles
Scanning Tunneling Microscopy (STM), electron tunneling, Tersoff-Hamann model, tip & surface preparation, imaging
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WEEK 5 |
Atomic Force Microscopy (AFM), AC and DC modes, detectors, control systems
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WEEK 6 |
Basic principles of piezoelectric elements in SPMs, major issues and solutions, SPM tip fabrication and selection, surface-tip interactions in different environments
Force/scale calibration, SPM non-linearies and remedies, image artifacts and deconvolution
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WEEK 7 |
Modeling of oscillating cantilever, force interactions with surface, stability conditions, AC modes, optimization of AC/DC experiments
Limits on interaction forces (thermal noise), high-resolution NC-AFM, simulation of NC-AFM images
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OPERATIONS IN SCANNING PROBE MICROSCOPY
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WEEK 8 |
Lab #1: Basics of Atomic Force Microscopy
Lab #2: Instrumented Nanoindentation
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WEEK 9 |
Force spectroscopy, force-distance curves, jump-to-contact instability, limitations in force resolution
Interfacial Force Microscopy (IFM), nanoindentation via AFM
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WEEK 10 |
Energy dissipation at the AFM tip, phase detection, frequency shift, lateral contact stiffness, Scanning Thermal (SThM) Microscopy
Electrostatic Force (EFM) and Kelvin Probe Microscopy, Scanning Capacitance (SCM), Quantitative Magnetic Force (MFM), Magnetic Resonance Force Microscopy (MRFM)
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WEEK 11 |
Lab #3: Advanced Operations in Atomic Force Microscopy
Lab #4: Measurement of Adhesion and the Nanoscale
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WEEK 12 |
Near-field Scanning Optical Microscopy (NSOM), instrumentation, applications of NSOM
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ADVANCED APPLICATIONS IN SCANNING PROBE MICROSCOPY
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WEEK 13 |
Manipulation of atoms via SPM, quantum mirage, dip-pen lithography, millipede memory
Atomic friction, frictional studies by SPM, quantitative mechanics at the nanometer scale
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WEEK 14 |
Application of SPM to biological systems, molecular spectroscopy, sensor arrays, macromolecular deposition/unfolding/binding, cellular and sub-cellular imaging/spectroscopy
Liquid imaging, low force imaging of living cells, active Q-control, time-lapse AFM
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