Ioannis ChasiotisAssociate Professorchasioti@uiuc.edu |
Return to: Faculty |
| Office address | Mailing Address | Research Group |
|---|---|---|
| 305A Talbot Lab 217-244-1474 |
306 Talbot Lab 104 S Wright St. Urbana, IL 61801 |
Nanomechanics and Materials Research Lab (NMRL) |
| Research Areas | ||
| Experimental mechanics at the nanoscale; mechanical reliability, fracture, and fatigue of MicroElectroMechanical Systems (MEMS); NEMS and thin film electronic materials; failure mechanics of inhomogeneous/anisotropic materials; deformation and damage mechanics of polymer nanocomposites and soft nanophase materials; and applications of scanning probe microscopy in mechanics and biology. | ||
Education:
- Ph.D., Aeronautics, California Institute of Technology, 2002
- M.S., Aeronautics, California Institute of Technology, 1998
- Diploma, Chemical Engineering, Aristotle University of Thessaloniki, Greece, 1996
Academic Positions:
- Assistant Professor, Aerospace Engineering, University of Illinois at Urbana-Champaign (UIUC), Urbana, Illinois, 2005-present
- Part-time Faculty of the Beckman Institute for Advanced Science and Technology, UIUC, 2005-present
- Research Assistant Professor Micro and Nanotechnology Laboratory, UIUC, 2005-present
- Assistant Professor, Mechanical and Aerospace Engineering, University of Virginia, 2001-2004
Major Honors and Awards:
- Office of Naval Research Young Investigator Award, 2007
- Xerox Award for Faculty Research, College of Engineering, University of Illinois at Urbana-Champaign, 2007
- Best Research Paper Award, 6th International Symposium on MEMS and Nanotechnology, Society for Experimental Mechanics, Portland, OR. June 2005
- American Academy of Mechanics (AAM) Founders Prize and Grant, October 2000
- Charles Babcock Memorial Award, California Institute of Technology, June 1999
- Outstanding Research Presentation Award by the American Vacuum Society, September 1998
Selected Publications:
- K. Jonnalagadda, S. Cho, I. Chasiotis, T.A. Friedman, and J. Sullivan, “Effect of Intrinsic Stress Gradient on the Effective Mode-I Fracture Toughness of Amorphous Diamond-like Carbon Films for MEMS,” Journal of the Mechanics and Physics of Solids, (2007).
- S.W. Cho and I. Chasiotis, “Elastic Properties and Representative Volume Element of Polycrystalline Silicon for MEMS,” Experimental Mechanics 47 (1), pp. 37-49, (2007).
- S.W. Cho K. Jonnalagadda, and I. Chasiotis, (Invited) “Mode I and Mixed Mode Fracture of Polysilicon for MEMS,” Fatigue and Fracture of Engineering Materials and Structures 30 (1), pp. 21-31, (2007).
- A. McCarty, and I. Chasiotis, “Description of Brittle Failure of Non-uniform MEMS Geometries”, Thin Solid Films 515, pp. 3267-3276, (2007).
- I. Chasiotis, S.W. Cho, K. Jonnalagadda, “Fracture Toughness and Subcritical Crack Growth in Polycrystalline Silicon,” Journal of Applied Mechanics 73 (5), pp. 714-722, (2006).
- I. Chasiotis, Q. Chen, G. Odegard, T. Gates, “Structure-Properties Relationships in Graphite Platelet-Reinforced Polymer Composites,” Experimental Mechanics 45 (6), pp. 507-516, (2005).
- S. Cho, J.F. Cárdenas-García, I. Chasiotis, “Measurement of Nano-displacements and Elastic Properties of MEMS via the Microscopic Hole Method,” Sensors and Actuators A Physical 120, pp. 163-171, (2005).
- S.W. Cho and I. Chasiotis, T.A. Friedman, and J. Sullivan, "Direct Measurements of Young's Modulus, Poisson's Ratio and Failure Properties of ta-C MEMS," Journal of Micromechanics and Microengineering 15 (4), pp. 728-735, (2005).
- I. Chasiotis, Invited Paper: "Mechanics of Thin Films and Microdevices," IEEE Transactions of Devices, Materials, and Reliability 4 (2), pp. 176-188, (2004).
- I. Chasiotis, W.G. Knauss, "Experimentation at the Micron- and Submicron Scale," in Comprehensive Structural Integrity Vol. 8. Interfacial and Nanoscale Failure. Volume Editors: W. Gerberich and W. Yang, Elsevier Science, pp. 41-87, (2003).
- I. Chasiotis, W.G. Knauss, "The Mechanical Strength of Polysilicon Films: 2. Size Effects Associated with Elliptical and Circular Perforations," J. of the Mechanics and Physics of Solids 51, pp. 1551-1572, (2003).
- I. Chasiotis, W.G. Knauss, "A New Microtensile Tester for the Study of MEMS Materials with the aid of Atomic Force Microscopy," Experimental Mechanics 42 (1), pp. 51-57, (2002).

