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AE Photo is "Image of the Week"

The Imaging Technology Group at the Beckman Institute for Advanced Science and Technology has chosen as an "image of the week" a photograph AE Prof. Eric Loth's research group has produced.

AE's Naraghi Takes First for Second Year in Sandia Lab Contest

Ph.D. candidate Mohammad Naraghi, under the direction of Professor Ioannis Chasiotis, has taken a first place at Sandia National Laboratory's University Alliance competition for the second consecutive year!

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May 26
Memorial Day

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Chasiotis

Ioannis Chasiotis

Assistant Professor

chasioti@uiuc.edu		 Return to: Faculty
Office address Mailing Address Research Group
305A Talbot Lab
217-244-1474		 306 Talbot Lab
104 S Wright St.
Urbana, IL 61801		 Nanomechanics and Materials Research Lab (NMRL)
Research Areas
Experimental mechanics at the nanoscale; mechanical reliability, fracture, and fatigue of MicroElectroMechanical Systems (MEMS); NEMS and thin film electronic materials; failure mechanics of inhomogeneous/anisotropic materials; deformation and damage mechanics of polymer nanocomposites and soft nanophase materials; and applications of scanning probe microscopy in mechanics and biology.

Education:

  • Ph.D., Aeronautics, California Institute of Technology, 2002
  • M.S., Aeronautics, California Institute of Technology, 1998
  • Diploma, Chemical Engineering, Aristotle University of Thessaloniki, Greece, 1996

Academic Positions:

  • Assistant Professor, Aerospace Engineering, University of Illinois at Urbana-Champaign (UIUC), Urbana, Illinois, 2005-present
  • Part-time Faculty of the Beckman Institute for Advanced Science and Technology, UIUC, 2005-present
  • Research Assistant Professor Micro and Nanotechnology Laboratory, UIUC, 2005-present
  • Assistant Professor, Mechanical and Aerospace Engineering, University of Virginia, 2001-2004

Major Honors and Awards:

  • Office of Naval Research Young Investigator Award, 2007
  • Xerox Award for Faculty Research, College of Engineering, University of Illinois at Urbana-Champaign, 2007
  • Best Research Paper Award, 6th International Symposium on MEMS and Nanotechnology, Society for Experimental Mechanics, Portland, OR. June 2005
  • American Academy of Mechanics (AAM) Founders Prize and Grant, October 2000
  • Charles Babcock Memorial Award, California Institute of Technology, June 1999
  • Outstanding Research Presentation Award by the American Vacuum Society, September 1998

Selected Publications:

  • K. Jonnalagadda, S. Cho, I. Chasiotis, T.A. Friedman, and J. Sullivan, “Effect of Intrinsic Stress Gradient on the Effective Mode-I Fracture Toughness of Amorphous Diamond-like Carbon Films for MEMS,” Journal of the Mechanics and Physics of Solids, (2007).
  • S.W. Cho and I. Chasiotis, “Elastic Properties and Representative Volume Element of Polycrystalline Silicon for MEMS,” Experimental Mechanics 47 (1), pp. 37-49, (2007).
  • S.W. Cho K. Jonnalagadda, and I. Chasiotis, (Invited) “Mode I and Mixed Mode Fracture of Polysilicon for MEMS,” Fatigue and Fracture of Engineering Materials and Structures 30 (1), pp. 21-31, (2007).
  • A. McCarty, and I. Chasiotis, “Description of Brittle Failure of Non-uniform MEMS Geometries”, Thin Solid Films 515, pp. 3267-3276, (2007).
  • I. Chasiotis, S.W. Cho, K. Jonnalagadda, “Fracture Toughness and Subcritical Crack Growth in Polycrystalline Silicon,” Journal of Applied Mechanics 73 (5), pp. 714-722, (2006).
  • I. Chasiotis, Q. Chen, G. Odegard, T. Gates, “Structure-Properties Relationships in Graphite Platelet-Reinforced Polymer Composites,” Experimental Mechanics 45 (6), pp. 507-516, (2005).
  • S. Cho, J.F. Cárdenas-García, I. Chasiotis, “Measurement of Nano-displacements and Elastic Properties of MEMS via the Microscopic Hole Method,” Sensors and Actuators A Physical 120, pp. 163-171, (2005).
  • S.W. Cho and I. Chasiotis, T.A. Friedman, and J. Sullivan, "Direct Measurements of Young's Modulus, Poisson's Ratio and Failure Properties of ta-C MEMS," Journal of Micromechanics and Microengineering 15 (4), pp. 728-735, (2005).
  • I. Chasiotis, Invited Paper: "Mechanics of Thin Films and Microdevices," IEEE Transactions of Devices, Materials, and Reliability 4 (2), pp. 176-188, (2004).
  • I. Chasiotis, W.G. Knauss, "Experimentation at the Micron- and Submicron Scale," in Comprehensive Structural Integrity Vol. 8. Interfacial and Nanoscale Failure. Volume Editors: W. Gerberich and W. Yang, Elsevier Science, pp. 41-87, (2003).
  • I. Chasiotis, W.G. Knauss, "The Mechanical Strength of Polysilicon Films: 2. Size Effects Associated with Elliptical and Circular Perforations," J. of the Mechanics and Physics of Solids 51, pp. 1551-1572, (2003).
  • I. Chasiotis, W.G. Knauss, "A New Microtensile Tester for the Study of MEMS Materials with the aid of Atomic Force Microscopy," Experimental Mechanics 42 (1), pp. 51-57, (2002).